APA   Click to copy
Singh, S., & Mohapatra, Y. N. (2017). Bias stress effect in solution-processed organic thin-film transistors: Evidence of field-induced emission from interfacial ions.

Chicago/Turabian   Click to copy
Singh, S., and Y. N. Mohapatra. “Bias Stress Effect in Solution-Processed Organic Thin-Film Transistors: Evidence of Field-Induced Emission from Interfacial Ions” (2017).

MLA   Click to copy
Singh, S., and Y. N. Mohapatra. Bias Stress Effect in Solution-Processed Organic Thin-Film Transistors: Evidence of Field-Induced Emission from Interfacial Ions. 2017.

@article{s2017a,
  title = {Bias stress effect in solution-processed organic thin-film transistors: Evidence of field-induced emission from interfacial ions},
  year = {2017},
  author = {Singh, S. and Mohapatra, Y. N.}
}