APA   Click to copy
Singh, S. P., Rao, V., Mohapatra, Y. N., Rangan, S., & Ashok, S. (2002). Electrical Signature of Ion-Implantation Induced Defects in n-Silicon in the Defect Cluster Regime Studied using DLTS and Isothermal Transient Spectroscopies.

Chicago/Turabian   Click to copy
Singh, Samarendra P., V. Rao, Y. N. Mohapatra, S. Rangan, and S. Ashok. “Electrical Signature of Ion-Implantation Induced Defects in n-Silicon in the Defect Cluster Regime Studied Using DLTS and Isothermal Transient Spectroscopies” (2002).

MLA   Click to copy
Singh, Samarendra P., et al. Electrical Signature of Ion-Implantation Induced Defects in n-Silicon in the Defect Cluster Regime Studied Using DLTS and Isothermal Transient Spectroscopies. 2002.

@article{samarendra2002a,
  title = {Electrical Signature of Ion-Implantation Induced Defects in n-Silicon in the Defect Cluster Regime Studied using DLTS and Isothermal Transient Spectroscopies},
  year = {2002},
  author = {Singh, Samarendra P. and Rao, V. and Mohapatra, Y. N. and Rangan, S. and Ashok, S.}
}