APA   Click to copy
Singh, S. P., Mohapatra, Y. N., Rangan, S., & Ashok, S. (2002). Carrier dynamics at Deep traps in ion implanted silicon: Possible signature of defect clusters.

Chicago/Turabian   Click to copy
Singh, Samarendra P., Y. N. Mohapatra, S. Rangan, and S. Ashok. “Carrier Dynamics at Deep Traps in Ion Implanted Silicon: Possible Signature of Defect Clusters” (2002).

MLA   Click to copy
Singh, Samarendra P., et al. Carrier Dynamics at Deep Traps in Ion Implanted Silicon: Possible Signature of Defect Clusters. 2002.

@article{samarendra2002a,
  title = {Carrier dynamics at Deep traps in ion implanted silicon: Possible signature of defect clusters},
  year = {2002},
  author = {Singh, Samarendra P. and Mohapatra, Y. N. and Rangan, S. and Ashok, S.}
}