ynm - Unusual features in trap emission characteristics of heavily

Journal article

P. Giri, Y. N. Mohapatra
2000

Cite

APA Click to copy
Giri, P., & Mohapatra, Y. N. (2000). Unusual features in trap emission characteristics of heavily damaged silicon induced by MeV ion implantation.

Chicago/Turabian Click to copy
Giri, P., and Y. N. Mohapatra. “Unusual Features in Trap Emission Characteristics of Heavily Damaged Silicon Induced by MeV Ion Implantation” (2000).

MLA Click to copy
Giri, P., and Y. N. Mohapatra. Unusual Features in Trap Emission Characteristics of Heavily Damaged Silicon Induced by MeV Ion Implantation. 2000.

BibTeX Click to copy

@article{p2000a,
  title = {Unusual features in trap emission characteristics of heavily damaged silicon induced by MeV ion implantation},
  year = {2000},
  author = {Giri, P. and Mohapatra, Y. N.}
}