APA   Click to copy
Mohapatra, Y. N., & Giri, P. (1999). Sensitivity of Electrically Active Defect Spectra to Processing Conditions in Mev Heavy Ion Implanted Silicon.

Chicago/Turabian   Click to copy
Mohapatra, Y. N., and P. Giri. “Sensitivity of Electrically Active Defect Spectra to Processing Conditions in Mev Heavy Ion Implanted Silicon” (1999).

MLA   Click to copy
Mohapatra, Y. N., and P. Giri. Sensitivity of Electrically Active Defect Spectra to Processing Conditions in Mev Heavy Ion Implanted Silicon. 1999.

@article{y1999a,
  title = {Sensitivity of Electrically Active Defect Spectra to Processing Conditions in Mev Heavy Ion Implanted Silicon},
  year = {1999},
  author = {Mohapatra, Y. N. and Giri, P.}
}