ynm - Electrical characterization of MeV heavy-ion-induced damage in

Journal article

P. Giri, Y. N. Mohapatra
1998

Cite

APA Click to copy
Giri, P., & Mohapatra, Y. N. (1998). Electrical characterization of MeV heavy-ion-induced damage in silicon: Evidence for defect migration and clustering.

Chicago/Turabian Click to copy
Giri, P., and Y. N. Mohapatra. “Electrical Characterization of MeV Heavy-Ion-Induced Damage in Silicon: Evidence for Defect Migration and Clustering” (1998).

MLA Click to copy
Giri, P., and Y. N. Mohapatra. Electrical Characterization of MeV Heavy-Ion-Induced Damage in Silicon: Evidence for Defect Migration and Clustering. 1998.

BibTeX Click to copy

@article{p1998a,
  title = {Electrical characterization of MeV heavy-ion-induced damage in silicon: Evidence for defect migration and clustering},
  year = {1998},
  author = {Giri, P. and Mohapatra, Y. N.}
}