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Physics, Semicondcutors, Materials Science

Evidence of Defect Migration and Clustering in MeV Heavy Ion Damaged Silicon


Journal article


Y. N. Mohapatra, P. Girl
1998

Semantic Scholar DOI
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Cite

APA   Click to copy
Mohapatra, Y. N., & Girl, P. (1998). Evidence of Defect Migration and Clustering in MeV Heavy Ion Damaged Silicon.


Chicago/Turabian   Click to copy
Mohapatra, Y. N., and P. Girl. “Evidence of Defect Migration and Clustering in MeV Heavy Ion Damaged Silicon” (1998).


MLA   Click to copy
Mohapatra, Y. N., and P. Girl. Evidence of Defect Migration and Clustering in MeV Heavy Ion Damaged Silicon. 1998.


BibTeX   Click to copy

@article{y1998a,
  title = {Evidence of Defect Migration and Clustering in MeV Heavy Ion Damaged Silicon},
  year = {1998},
  author = {Mohapatra, Y. N. and Girl, P.}
}