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Physics, Semicondcutors, Materials Science

Electrically active defects in as-implanted, deep buried layers in p-type silicon


Journal article


P. Giri, S. Dhar, V. N. Kulkarni, Y. N. Mohapatra
1997

Semantic Scholar DOI
Cite

Cite

APA   Click to copy
Giri, P., Dhar, S., Kulkarni, V. N., & Mohapatra, Y. N. (1997). Electrically active defects in as-implanted, deep buried layers in p-type silicon.


Chicago/Turabian   Click to copy
Giri, P., S. Dhar, V. N. Kulkarni, and Y. N. Mohapatra. “Electrically Active Defects in as-Implanted, Deep Buried Layers in p-Type Silicon” (1997).


MLA   Click to copy
Giri, P., et al. Electrically Active Defects in as-Implanted, Deep Buried Layers in p-Type Silicon. 1997.


BibTeX   Click to copy

@article{p1997a,
  title = {Electrically active defects in as-implanted, deep buried layers in p-type silicon},
  year = {1997},
  author = {Giri, P. and Dhar, S. and Kulkarni, V. N. and Mohapatra, Y. N.}
}